• isi_ọkọlọtọ_01

Nyocha microstructure na nyocha nke ihe semiconductor

Nkọwa dị mkpirikpi:


Nkọwa ngwaahịa

Mkpado ngwaahịa

Okwu Mmalite ọrụ

Site na mmepe nke nnukwu sekit agbakwunyere na-aga n'ihu, usoro nrụpụta mgbawa na-adịwanye mgbagwoju anya, na microstructure na-adịghị mma na ngwakọta nke ihe semiconductor na-egbochi mmụba nke mkpụrụ mgbawa, nke na-eweta nnukwu nsogbu na mmejuputa semiconductor ọhụrụ na njikọta. teknụzụ sekit.

GRGTEST na-enye nyocha na nyocha microstructure ihe semiconductor zuru oke iji nyere ndị ahịa aka imeziwanye semiconductor na usoro sekit agbakwunyere, gụnyere nkwadebe nke profaịlụ wafer na nyocha eletrọnịkị, nyocha zuru oke nke akụrụngwa anụ ahụ na kemịkalụ nke ihe nrụpụta semiconductor, nhazi na mmejuputa nyocha ihe mmetọ nke semiconductor. mmemme.

Oke ọrụ

Ihe Semiconductor, ihe obere ihe molekul organic, ihe polymer, ihe ngwakọ organic / inorganic, ihe inorganic na-abụghị ọla.

Mmemme ọrụ

1. Chip wafer larịị profaịlụ nkwadebe na eletrọnịkị analysis, dabere na lekwasịrị anya ion beam technology (DB-FIB), kpomkwem igbubi mpaghara mpaghara nke mgbawa, na ozugbo eletrọnịkị imaging, nwere ike nweta mgbawa profaịlụ Ọdịdị, mejupụtara na ndị ọzọ. ozi usoro dị mkpa;

2. Nyocha zuru oke nke ihe anụ ahụ na nke kemịkal nke ihe nrụpụta semiconductor, gụnyere ihe ndị na-emepụta ihe na-emepụta ihe na-emepụta ihe, gụnyere ihe ndị na-emepụta ihe na-emepụta ihe, obere ihe ndị na-emepụta ihe, ihe ndị na-emepụta ihe na-emepụta ihe na-abụghị ọla, nyocha nke usoro ihe omimi, wdg;

3. Nhazi na mmejuputa atụmatụ nyocha ihe mmetọ maka ihe semiconductor.Ọ nwere ike inyere ndị ahịa aka ịghọta nke ọma njirimara anụ ahụ na kemịkalụ nke mmetọ, gụnyere: nyocha ihe mejupụtara kemịkalụ, nyocha ọdịnaya akụrụngwa, nyocha usoro ihe omimi na nyocha njirimara anụ ahụ na kemịkal ndị ọzọ.

Ihe ọrụ

Ọrụụdị

Ọrụihe

Nyocha ihe mejupụtara nke elementrị nke ihe semiconductor

l EDS elemental analysis,

l X-ray photoelectron spectroscopy (XPS) elemental analysis

Nyocha usoro ihe omimi nke ihe semiconductor

l FT-IR infrared spectrum analysis,

l X-ray diffraction (XRD) spectroscopic analysis,

l Ntụle ndọta resonance nke nuklia (H1NMR, C13NMR)

Nyocha microstructure nke ihe semiconductor

l nyocha mpempe ion abụọ lekwasịrị anya (DBFIB),

l A na-eji microscopy eletrọnịnụ eletrọnịnụ (FESEM) tụọ ma na-eleba anya n'ihe gbasara morphology.

l Atomic Force microscopy (AFM) maka nleba anya morphology elu


  • Nke gara aga:
  • Osote:

  • Dee ozi gị ebe a ziga anyị ya